Synopsys Introduces Industry’s First On-Chip Memory Test and Repair Solution for Embedded Flash
Design Ware STAR Memory System for Embedded Flash Reduces Test Cost by 20Percentand Enables In-Field Diagnostics for IoT and Automotive...
Design Ware STAR Memory System for Embedded Flash Reduces Test Cost by 20Percentand Enables In-Field Diagnostics for IoT and Automotive...
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