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NI and Hewlett Packard Enterprise Collaborate to Make Available Pre-Tested Big Analog Data™ Solutions

Electronics Maker by Electronics Maker
June 9, 2016
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NI and HPE Announce a Pre-Tested Solution to Analyze Time-Series Sensor Data

Bangalore, India – June 09, 2016 – NI  and Hewlett Packard Enterprise (HPE) (Nasdaq: HPE), announced today a collaboration to facilitate the availability of pre-tested Big Analog Data™ solutions based on NI DataFinder Server Edition software and HPE Moonshot Systems. Engineers must collect and manage sensor data that is fundamentally different than what traditional big data solutions typically tackle. The collaboration of HPE, a global leader in computing and data processing, with NI, a leader in data acquisition and analysis, is expected to result in the availability of a pre-tested best-in-class hardware and software combination for solving engineering data management problems and making decisions from sensor data more effectively.

“The DataFinder-Moonshot Big Analog Data™ solution is a potent combination, making it easier for engineers to rapidly deploy and gain insight from manufacturing, test and Internet of Things (IoT) data,” said Dr. Tom Bradicich, vice president and general manager of servers and IoT systems at HPE. “With this pre-tested solution, HPE and NI are helping our customers to reduce their integration risks.”

Combining the multiple award winning HPE Moonshot Systems and DataFinder Server Edition provides engineers with a complete, pre-validated, tested solution to manage and analyze the complexities of file-based sensor data. With DataFinder Server Edition software running on HPE Moonshot server blades, users can manage structured and unstructured data generated from any data acquisition analysis node.

“With the IoT and the emergence of more connected systems, our customers are collecting more data than ever before,” said Eric Starkloff, executive vice president of global sales and marketing at NI. “By analyzing more of their data in a reliable and accurate way, our customers can better document the results of their tests and take actionable steps to improve the efficiency and designs of their applications.”

Both companies will showcase this technology at HPE Discover in Las Vegas, June 7 – 9 and at NIWeek in Austin, Texas, August 1– 4. For more information, visit www.ni.com/datafinder and www.hpe.com/info/moonshot.

Tags: Test and Measurement
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