Electronics Maker
  • Home
  • Electronics News
  • Articles
  • Magazine
  • Events
  • Interview
  • Electronics Projects
No Result
View All Result
  • Home
  • Electronics News
  • Articles
  • Magazine
  • Events
  • Interview
  • Electronics Projects
No Result
View All Result
Electronics Maker
No Result
View All Result
Home Spotlight

Agilent High-Precision Pulse Function Arbitrary Noise Generator for Testing Higher Speed, Higher Ban

Team Electronics by Team Electronics
March 28, 2014
in Spotlight
0
0
SHARES
77
VIEWS
Share on FacebookShare on Twitter
Pulse Function Arbitrary Noise Generator
Pulse Function Arbitrary Noise Generator

Agilent Technologies Inc.expanded its pulse function arbitrary noise generator family to help R&D and test engineers test higher speed, higher bandwidth analog, digital and mixed-signal devices more efficiently and with greater precision.

Design and test engineers are under pressure to get products to market faster, with shorter design schedules and yet higher quality goals. In addition, they must differentiate their products in the marketplace by offering unique capabilities, which necessitates expanded test functionality during development. The Agilent 81160A pulse function arbitrary noise generator provides innovative functionality and streamlined setup to help engineers complete a broader test set more quickly.

The Agilent 81160A pulse function arbitrary noise generator eliminates the need for cumbersome multi-instrument setups for stress testing devices. Like the 81150A, the 81160A provides versatile waveforms along with superior signals with an intrinsic jitter of 7 ps rms. This combination of characteristics helps engineers define better performance specifications for their devices. The 81160A is ideal for general-purpose bench tests and advanced serial data stress tests. Capabilities include:
generation of 330-MHz pulses and 500-MHz function/arbitrary waveforms with a 2.5-GSa/s sample rate and 14-bit vertical resolution;
selectable crest factors for white Gaussian noise lets engineers determine how much distortion to apply to a device during stress testing to meet various serial bus standards;
glitch-free timing parameter changes allow engineers to change the frequency without drop-outs or glitches and enable continuous operation without rebooting or resetting the device under test; and arbitrary bit patterns show capacitive load of the channels using simple pattern settings. Complex measurement setups are no longer necessary to test designs to their limits.

For more information please contact:
Agilent Technologies India Pvt Ltd
Floor 1 , Unit No 105-116, Splendor Forum, Plot 3, Jasola District Centre, New Delhi
Tel: 1800-11-2929 (Toll Free) / 0124 229 2009
Email: tm_india@agilent.com
Website: www.agilent.com

Team Electronics

Team Electronics

Subscribe Newsletter

Subscribe to our mailing list to receives daily updates direct to your inbox!

*we hate spam as much as you do

Electronics Maker

It is a professionally managed electronics print media with highly skilled staff having experience of this respective field.

Subscribe Newsletter

Subscribe to our mailing list to receives daily updates direct to your inbox!

*we hate spam as much as you do

Quick Links

  • »   Electronics News
  • »   Articles
  • »   Magazine
  • »   Events
  • »   Interview
  • »   About Us
  • »   Contact Us

Contact Us

EM Media LLP
  210, II nd Floor, Sager Plaza – 1, Road No-44,, Plot No-16, Pitampura, New Delhi - 110034
  01145629941
  info@electronicsmaker.com
  www.electronicsmaker.com

  • Advertise with Us
  • Careers
  • Terms Of Use
  • Privacy Policy
  • Disclaimer
  • Cookie Policy

© 2020 Electronics Maker. All rights reserved.

No Result
View All Result
  • Home
  • Electronics News
  • Articles
  • Magazine
  • Events
  • Interview
  • Electronics Projects

© 2020 Electronics Maker. All rights reserved.