Tektronix Delivers First LPDDR4 PHY Layer Test Solution
Extends Tektronix’ Comprehensive DDR Test Solution to Support New High-Speed, Low-Power Memory Interfaces for Mobile Devices BANGALORE, India, Oct. 27, ...
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Tag: Test and Measurement
Tektronix MDO3000 Named Editor’s Choice by Embedded Computing Design
New Integrated Oscilloscope Cited for Saving Space and Cost, Making It “a Good Choice for Small and Large Development Organizations” ...
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Livingston Enables Drive Testing via Smartphone
17th October 2014 – In order to maximise the optimization and troubleshooting possibilities when deploying next generation wireless networks, test ...
Read moreNI Collaborates With CROWD to Define 5G Wireless Communications
As a CROWD Member, NI Researches Reliable High-Speed Data Access at All Points in Dense Networks Through Small Cell Densification ...
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Anritsu Mobile Interference Hunting System Makes Locating Interferers Easier, Faster, and More Economical
New Interference Hunting System Simplifies Detection of Numerous Interferers Over Wide Range of Power Levels in Multiple RF Environments Morgan ...
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Anritsu expands ShockLine™ family of Vector Network Analyzers
MS46122A VNAs Address Passive Device Testing Requirements in Manufacturing, Engineering, and Education Environments Morgan Hill, CA – October 7, 2014 ...
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Anritsu Introduces First Handheld Field PIM Analyzer combines Multiple Instruments
Morgan Hill, CA – 1 OCT 2014 – Anritsu Company breaks new ground in field wireless test with the introduction ...
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