JTAG Technologies Inside – The future of your ATE application with boundary-scan
Eindhoven, The Netherlands, October 2015 — The access to nodes of assemblies with ever increasing complexity is more and more ...
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Tag: Test and Measurement
Anritsu Company Extends Frequency Coverage of ShockLine™ Compact and Economy VNA Families to 43.5 GHz
MS46122A and MS46322A Series Ideal for Measuring RF/Microwave Passive Devices in Variety of Cost-sensitive Engineering, Manufacturing and University Applications Morgan ...
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Anritsu India organizes Conference on “LTE-Advanced & Beyond”
Bangalore, October 16, 2015: Anritsu India Private Limited organized a conference on “LTE-Advanced & Beyond” in Hyderabad and Bangalore on ...
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Anritsu released High Performance Waveguide Mixer MS2830A
With the October 15 release of its new High Performance Waveguide Mixer (60 to 90 GHz) MA2808A for the company's ...
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Anritsu displays Mission Critical, Peace Time and Homeland Security Test and Measurement Solution at IISE
Noida, Oct 11th, 2015 – Anritsu India Pvt Ltd, 100% subsidiary of Anritsu Corporation Japan and Anritsu Company USA participated ...
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Rohde & Schwarz and Tata Power Strategic Engineering Division have signed a MoU committed for MAKE in INDIA…
The two companies are pursuing cooperation for Terrestrial Radio Communication solutions using Software Defined Radios to address the requirements of ...
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Intel Chooses Averna for Testing DOCSIS 3.1 Chipsets
Averna's DOCSIS 3.1 Protocol Analyzer Accelerates Design Validation and Certification Montreal, Canada, Oct 7, 2015 - Averna, an industry-leading developer ...
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