The demand for more efficient high voltage semiconductors in 5G, automotive, alternative energy and other applications is leading researchers toward new materials including SiC (Silicon Carbide) and GaN (Gallium Nitride). These wide bandgap semiconductors pose increasingly complex test challenges in research and product development as well as manufacturing. In particular, test instrumentation must be able to handle high voltage levels and quickly and accurately measure low current.
To meet this growing requirement, Tektronix has introduced the Keithley 2470 SourceMeter® Source Measure Unit. The newest member of Keithley’s graphical SMU family can test materials and devices up to 1,100 V and measure low current with 10 fA resolution. It includes a 5-in. capacitive touch display with the full touch experience to make testing intuitive and minimize the learning curve.
The 2470 is optimized for characterizing and testing a broad range of high voltage, low leakage devices, materials, and modules. In addition to SiC and GaN, it’s well suited for use with power MOSFETs,transient suppression devices, circuit protection devices,power modules, batteries, andmore. These new capabilities make the 2470 the “go-to instrument” for high-voltage source and low-current measurement applications in the lab and in the manufacturing test rack.
The 2470 represents Keithley’s fourth generation of SourceMeterSMUs and offers a highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current measurements. The 2470’s power envelope is shown below. This all-in-one instrument has the capabilities of a:
- Precision power supply with V and I readback
- True current source
- Digital multimeter (DCV, DCI, ohms, and power with 6½-digit resolution)
- Precision electronic load
- Trigger controller
The power envelope of the 2470 SMU extends to 1,100 V Work smarter, invent easier
Like other members of Keithley’s 2400 family, the new 2470 benefits from the Touch, Test Invent®user interface. As shown below, its simple icon-based menu structure reduces the number of steps required to configure a test by as much as 50% and eliminates cumbersome multi-layer menu structures. Built-in, context-sensitive help supports intuitive operation and minimizes the need to review a separate manual. These capabilities, combined with the 2470’s high versatility, simplify its operation in both basic and advanced measurement applications, regardless of the user’s previous experience in working with SMU instruments.
The 2470’s icon-based menu structure reduces test configuration steps by as much as 50% To see the 2470 in action, be sure to check out the video below where product manager John Tucker provides a short overview on the capabilities of the new instrument. For more detail on the full line of 2400 Series SMUs, go to: https://www.tek.com/keithley-source-measure-units/keithley-smu-2400-series-sourcemeter. Available now, the 2470 SMU is priced from $9,950 US MSRP.
