Eindhoven, The Netherlands, October 2015 — The access to nodes of assemblies with ever increasing complexity is more and more difficult and results in reduced fault coverage. Test engineers worry about this daily.
JTAG Technologies’ motto for this productronica year reads: Optimise your ATE with JTAG Technologies Inside — have a look at the possibilities that arise from the use of “JTAG TECHNOLOGIES INSIDE” and see your current test methods and possibilities from a different perspective. In our booth A1.458 at productronica we will display the following highlights from our comprehensive ATE product portfolio:
- ICT, MDA or flying probe systems are quickly and easily upgraded with JTAG Technologies’ boundary-scan solutions. Special add-on cards and software integration suites enable users to benefit from the features of the combined systems.
- Traditional functional tests based on National Instruments’ LabView/TestStand, C++, .net and other programming languages often feature complex and time-consuming test programs. Easy access to your assembly via boundary-scan pins can simplify your existing test programs and ease diagnosis in case of faults.
Peter van den Eijnden, managing director of JTAG Technologies commented this year’s focus for the show: “Since many years we are cooperating with renowned ATE suppliers to make sure that our customers will continue to enjoy optimal use of their existing ICT/MDA/FPT/FCT systems throughout the coming years. In joint efforts with various test system manufacturers we developed special hardware and software solutions. These special solutions enable perfect integration of our tools into these test systems, so users benefit from advantages of the combination of both methods”.
