TI’s new ADCs deliver high accuracy, low noise and high integration for programmable logic controllers, industrial automation and sensor measurement
Bangalore, July 21, 2015: Texas Instruments today introduced a pair of 32-bit delta-sigma analog-to-digital converters (ADCs) that combine high resolution, low noise and integrated fault detection, eliminating many of the performance and features trade-offs typically associated with device evaluation and selection. The highly integrated, sensor-ready ADS1262 and ADS1263 also remove the need for external components that increase system cost and degrade noise and drift performance. For more information, visit www.ti.com/ads1262-pr.
Until now, system designers who needed a high-resolution ADC had to sacrifice other desired specifications, such as low noise or low offset drift, as well as several integrated features. The ADS1262 and ADS1263 eliminate these trade-offs by providing 32-bit resolution, along with integration, fault-detection features, a fast data rate and wide temperature range, to help maximize the performance of programmable logic controllers (PLCs), industrial automation equipment and sensor-measurement applications.
Key features and benefits of the ADS1262 and ADS1263
- Accurate measurements of small signals:High resolution of 32 bits and low noise of 7 nVRMS at 2.5 SPS enable measurement of the smallest signals, which is essential for bridge applications where typical full-scale signals are 10 mV or less. Offset error drift is also 80 percent lower than competitive solutions, ensuring measurement stability over the entire temperature range.
- Reduces component count to decrease system cost, board area and design time:The ADS1262 integrates a programmable gain amplifier (PGA), 2.5-V reference, oscillator, level shifter, temperature sensor, dual-excitation current sources (IDACs) and eight general-purpose input/output (GPIO) pins. The ADS1263 adds an auxiliary 24-bit delta-sigma ADC for systems needing parallel main-channel conversions, sensor-temperature compensation or sensor diagnostics.
- Integrated monitoring and diagnostics:Features such as internal signal-chain monitoring, data-error detection, sensor-burnout detection and a test digital-to-analog converter (DAC) provide the internal and external fault detection and diagnostics necessary for high-reliability systems. Read TI’s new white paper to learn how to use the ADS1262 and ADS1263’s integrated diagnostics to help improve system reliability.
- Fast data rate:A maximum output data rate of 38 kSPS enables the ADCs to be used in high-data-throughput industrial applications.
- Support for harsh industrial environments:The operating temperature range of -40°C to +125C is 20C wider than competing products.
