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Home Featured Articles

New test and programming strategies for Intel processors

Electronics Maker by Electronics Maker
January 7, 2015
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GOEPEL electronics introduces new test and programming strategies for Bay Trail processors from Intel®

Atom E3800GOEPEL electronics announces the development of specific model libraries for testing and programming of Intel® Bay Trail processors, which are part of the Intel® Atom™ family. The libraries called VarioTAP® models allow flexible execution of processor emulation tests using the native debug port. Users are now able to use the processor as an instrument for hardware design validation of prototypes as well as programming of Flash devices.

Intel® Bay Trail is a series of multi-core SoC (System-on-Chip) solutions based on the Silvermont architecture. Manufactured in a 22nm process, the Chips offer optimized performance with low energy consumption. Main application fields of the Bay Trail processors are mainly mobile applications such as tablets and notebooks, but also hybrid and embedded devices. There are various Intel® Bay Trail series with up to four processor cores and clock speeds up to 2GHz.

The processors are integrated in µFCBGA (Micro Flip Chip Ball Grid Array) packages with several hundred pins which are mounted directly on the board, not allowing direct contact with external instruments. VarioTAP® offers embedded instruments for test, hardware debugging, Flash programming and design validation even after mounting.

About VarioTAP®

VarioTAP® is a technology for processor emulation developed by GOEPEL electronic. Thereby, a processor is reconfigured to provide design-integrated test and programming instruments via the native debug port. A respective VarioTAP® model, as part of an extensive IP library, contains all relevant access information for the respective target processor. On this basis users can select a processor corresponding to their design and be able to test and validate the connected hardware unit as well as program Flash memories.

Tags: featuredSemiconductor & ICtest and inspection
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